Scattering-Parameter Analysis of High-Speed Interconnects Using a Two-Port Network

Abstract

High-speed interconnects can affect signal transmission through reflections and frequency-dependent behavior. This paper examines the analysis of high-speed interconnects using a two-port network framework, with emphasis on scattering parameters (S-parameters) as a way to characterize transmission and reflection between ports. The manuscript presents the relevant theoretical background, equations, and analysis, supported by figures and MATLAB-based work. The aim is to provide a structured approach to interpreting interconnect behavior in high-speed electronic systems.