This is an outdated version published on 2026-05-13. Read the most recent version.
Preprint / Version 7

Physical Dilemma of Large-Area Advanced-Node Chips: Irreversible Narrowing of Interconnect Channels

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  • Ao Li Independent Researcher

DOI:

https://doi.org/10.31224/6828

Keywords:

Advanced Node, Interconnect Channel, Narrowing Effect, Resistance, Thermal Dissipation, Chiplet, Mature Process, Physical Limit, RC Delay, Controllability

Abstract

The two pathways to increasing chip computing power—process scaling and chip area expansion—have both reached their physical and economic limits. This paper demonstrates that the physical bottlenecks of advanced nodes and the contradictions of interconnect narrowing cannot be resolved by 2.5D/3D packaging or chiplet architectures, which merely shift costs rather than eliminate fundamental physical constraints. Industrial remedies are shown to create markets out of their own self-inflicted problems. As sub-1 nm nodes approach, uncontrollability overtakes usability. The only physically self-consistent path forward is a system-integration paradigm centered on mature-node chiplets, where wide interconnects, low thermal density, and traditional packaging together respect fundamental physical laws.

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Posted

2026-04-15 — Updated on 2026-05-13

Versions

Version justification

1. Added a complete author biography, clearly stating the research identity, core research direction and status of technical achievements, noting that core technical details are temporarily undisclosed for patent protection, and included a contact email for potential collaboration. ​ 2. Added and demonstrated the inherent logical paradox of chiplet architecture, pointing out the mutual exclusivity between its two core goals: avoiding the exponential yield degradation of large chips at advanced nodes and achieving logical equivalence of multi-chiplet systems to a single monolithic chip. This addition dismantles the mainstream industry chiplet narrative at its logical root and completes the full argumentative loop of the paper.