Preprint / Version 9

Physical Dilemma of Large-Area Advanced-Node Chips: Irreversible Narrowing of Interconnect Channels

##article.authors##

  • Ao Li Independent Researcher

DOI:

https://doi.org/10.31224/6828

Keywords:

Advanced Node, Interconnect Channel, Narrowing Effect, Resistance, Thermal Dissipation, Chiplet, Mature Process, Physical Limit, RC Delay, Controllability

Abstract

The two pathways to increasing chip computing power—process scaling and chip area expansion—have both reached their physical and economic limits. This paper demonstrates that the physical bottlenecks of advanced nodes and the contradictions of interconnect narrowing cannot be resolved by 2.5D/3D packaging or chiplet architectures, which merely shift costs rather than eliminate fundamental physical constraints. Industrial remedies are shown to create markets out of their own self-inflicted problems. As sub-1 nm nodes approach, uncontrollability overtakes usability. The only physically self-consistent path forward is a system-integration paradigm centered on mature-node chiplets, where wide interconnects, low thermal density, and traditional packaging together respect fundamental physical laws.

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Posted

2026-04-15 — Updated on 2026-05-18

Versions

Version justification

1. Added a mind map to provide readers with an intuitive overview of the paper's logical framework. 2. Supplemented Section 3 with a quantitative analysis of Rent's rule, and adjusted the opening of Section 4 accordingly.